Test and Diagnosis for Small-Delay Defects
Synopsis
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
- Derechos de autor:
- 2012 Springer
Book Details
- Book Quality:
- ISBN-13:
- 9781441982971
- Publisher:
- Springer New York
- Date of Addition:
- 2013-10-21T01:16:55Z
- Idioma:
- English
- Categorías:
- Usage Restrictions:
- This is a copyrighted book.